That's an interesting post, Eddie ... from which two comments immediately come to mind:-
1) Remember the old PM
mantra TLC? That is, never mind electrical safety testing, what about "tighten-lube-clean"? Surely those "loose" connections would (dare I say should?) have been picked up (rather than "accidentally" discovered)? Otherwise, why bother with PM at all?
2) Perhaps the world was a better, safer, place when ventilators didn't "crash" (see Cape-Waine
et al).
By the way, in my experience, "locking up" fault conditions are invariably due to a "bad connection" somewhere. I mention this as I know that some techs just love to dive straight in to swapping out NAND gates and all the rest. Such excited activity rarely wins the day. Of course the
real problem is tracking down which of the many candidates for "bad connection" is the actual culprit. Back to your own case, it seems that you were (or, should have been, lucky). One last point:-
how did these faults occur, I wonder? I'm guessing that they may have been as a result of over-zealous application of the
T in TLC ... am I right?
