DI :: Deviation Index
EI :: Exposure Index
EIt :: Target Exposure Index
DI = 10xLog10(EI/EIt) ... per IEC 62494
Example results range from something like -3 to +3, with -3 indicating severely under-exposed (try again using twice the mAs) and +3 indicating severely over-exposed (repeat using half the mAs). DI = zero is the perfect exposure being aimed for.
From the PACs that I manage, I am trying to do some work correlating the deterioration of X-ray beam quality (we have equipment with tubes that are almost 40 years old), user and exposure and deviation indices. I would like to take this opportunity to ask if anyone has a reference for modifying the dcm4chee administration interface to make visible the dicom fields associated with IE, TIE and DI?
